An extensive study for the impacts of structure-wise TSVs on position-oriented MOSFETs with TSV signal disturbance.

Details

Language :

English

ISBNs :

9781424450633

Database :

Complementary Index

Journal :

2010 International Symposium on VLSI Technology Systems & Applications (VLSI-TSA)

Publication Type :

Conference

Accession number :

81674304

Full Text :

https://doi.org/10.1109/VTSA.2010.5488903