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Determination of metal/Si contact temperature during electrical current stressing.
- Source :
- Twenty-First International Conference on Thermoelectrics, 2002. Proceedings ICT '02; 2002, p345-348, 4p
- Publication Year :
- 2002
Details
- Language :
- English
- ISBNs :
- 9780780376830
- Database :
- Complementary Index
- Journal :
- Twenty-First International Conference on Thermoelectrics, 2002. Proceedings ICT '02
- Publication Type :
- Conference
- Accession number :
- 81672006
- Full Text :
- https://doi.org/10.1109/ICT.2002.1190336