Proactive power migration to reduce maximum value and spatiotemporal non-uniformity of on-chip temperature distribution in homogeneous many-core processors.

Details

Language :

English

ISBNs :

9781424494583

Database :

Complementary Index

Journal :

26th Annual IEEE Semiconductor Thermal Measurement & Management Symposium, 2010. SEMI-THERM 2010

Publication Type :

Conference

Accession number :

81661616

Full Text :

https://doi.org/10.1109/STHERM.2010.5444295