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Validating foundry technologies for extended mission profiles.

Authors :
van Dijk, K.
Volf, P.A.J.
Detcheverry, C.
Yau, A.
Ngan, P.
Liang, Z.
Kuper, F.G.
Source :
2010 IEEE International Reliability Physics Symposium (IRPS); 2010, p111-116, 6p
Publication Year :
2010

Details

Language :
English
ISBNs :
9781424454303
Database :
Complementary Index
Journal :
2010 IEEE International Reliability Physics Symposium (IRPS)
Publication Type :
Conference
Accession number :
81658816
Full Text :
https://doi.org/10.1109/IRPS.2010.5488845
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