A testable design for asynchronous fine-grain pipeline circuits.

Authors :: Tsukisaka, M.
Nanya, T.
Source :: Proceedings 2000 Pacific Rim International Symposium on Dependable Computing; 2000, p148-155, 8p
Publication Year :: 2000

Language :: English
ISBNs :: 9780769509754
Database :: Complementary Index
Journal :: Proceedings 2000 Pacific Rim International Symposium on Dependable Computing
Publication Type :: Conference
Accession number :: 81655198
Full Text :: https://doi.org/10.1109/PRDC.2000.897297