Real-time study of strain relaxation in lattice-mismatched InGaAs/GaAs by x-ray diffraction.

Details

Language :

English

ISBNs :

9781424429493

Database :

Complementary Index

Journal :

2009 34th IEEE Photovoltaic Specialists Conference (PVSC)

Publication Type :

Conference

Accession number :

81642702

Full Text :

https://doi.org/10.1109/PVSC.2009.5411191