Vth fluctuation induced by statistical variation of pocket dopant profile.

Authors :: Tanaka, T.
Usuki, T.
Futatsugi, T.
Momiyama, Y.
Sugii, T.
Source :: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138); 2000, p271-274, 4p
Publication Year :: 2000

Language :: English
ISBNs :: 9780780364387
Database :: Complementary Index
Journal :: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138)
Publication Type :: Conference
Accession number :: 81623601
Full Text :: https://doi.org/10.1109/IEDM.2000.904309