Oblique fringe measurement by pattern correlation.

Authors :: Lanjiao Liu
Haiyan Pan
Jia Xu
Hongmei Xu
Yong Yue
Dayou Li
Zhengxun Song
Zhankun Weng
Zhen Hu
Zuobin Wang
Jin Zhang
Source :: 2010 IEEE International Conference on Information & Automation (ICIA); 2010, p940-945, 6p
Publication Year :: 2010

Language :: English
ISBNs :: 9781424457014
Database :: Complementary Index
Journal :: 2010 IEEE International Conference on Information & Automation (ICIA)
Publication Type :: Conference
Accession number :: 81615441
Full Text :: https://doi.org/10.1109/ICINFA.2010.5512137