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Characterization of non-destructive inspection data from composite structure defects.
- Source :
- Industrial Electronics, 2009. IECON '09. 35th Annual Conference of IEEE; 2009, p4319-4325, 7p
- Publication Year :
- 2009
Details
- Language :
- English
- ISBNs :
- 9781424446483
- Database :
- Complementary Index
- Journal :
- Industrial Electronics, 2009. IECON '09. 35th Annual Conference of IEEE
- Publication Type :
- Conference
- Accession number :
- 81613994
- Full Text :
- https://doi.org/10.1109/IECON.2009.5414921