65nm cmos technology for low power applications.

Authors :: Steegen, A.
Mo, R.
Mann, R.
Sun, M.-C.
Eller, M.
Leake, G.
Vietzke, D.
Tilke, A.
Guarin, F.
Fischer, A.
Pompl, T.
Massey, G.
Vayshenker, A.
Tan, W.L.
Ebert, A.
Lin, W.
Gao, W.
Lian, J.
Kim, J.-P.
Wrschka, P.
Source :: IEEE International Electron Devices Meeting, 2005. IEDM Technical Digest; 2005, p64-67, 4p
Publication Year :: 2005

Language :: English
ISBNs :: 9780780392687
Database :: Complementary Index
Journal :: IEEE International Electron Devices Meeting, 2005. IEDM Technical Digest
Publication Type :: Conference
Accession number :: 81610530
Full Text :: https://doi.org/10.1109/IEDM.2005.1609267