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Simultaneous switching noise analysis on bus lines using coupled circuit and electromagnetic simulation.

Authors :
Mabuchi, Y.
Suwa, M.
Fukumoto, H.
Nakamura, A.
Source :
IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565); 2001, p203-206, 4p
Publication Year :
2001

Details

Language :
English
ISBNs :
9780780370241
Database :
Complementary Index
Journal :
IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)
Publication Type :
Conference
Accession number :
81609968
Full Text :
https://doi.org/10.1109/EPEP.2001.967646