{113} defect-engineered silicon light-emitting diodes.

Authors :: Pan, G.Z.
Ostroumov, R.P.
Lian, Y.G.
Tu, K.N.
Wang, K.L.
Source :: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004; 2004, p343-346, 4p
Publication Year :: 2004

Language :: English
ISBNs :: 9780780386846
Database :: Complementary Index
Journal :: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004
Publication Type :: Conference
Accession number :: 81609684
Full Text :: https://doi.org/10.1109/IEDM.2004.1419152