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A high resolution on-chip beat frequency detection system for measuring BTI, HCI, and TDDB.

Authors :
Keane, J.
Xiaofei Wang
Persaud, D.
Kim, C.H.
Source :
2010 IEEE International Conference on IC Design & Technology (ICICDT); 2010, p142-145, 4p
Publication Year :
2010

Details

Language :
English
ISBNs :
9781424457731
Database :
Complementary Index
Journal :
2010 IEEE International Conference on IC Design & Technology (ICICDT)
Publication Type :
Conference
Accession number :
81609291
Full Text :
https://doi.org/10.1109/ICICDT.2010.5510268