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Top-Down Reuse for Multi-level Testing.
- Source :
- 2010 17th IEEE International Conference & Workshops on Engineering of Computer Based Systems (ECBS); 2010, p150-159, 10p
- Publication Year :
- 2010
Details
- Language :
- English
- ISBNs :
- 9781424465378
- Database :
- Complementary Index
- Journal :
- 2010 17th IEEE International Conference & Workshops on Engineering of Computer Based Systems (ECBS)
- Publication Type :
- Conference
- Accession number :
- 81604435
- Full Text :
- https://doi.org/10.1109/ECBS.2010.23