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Investigation of the shielding on the mobile phone PCB using FDTD.

Authors :
Chung-Huan Li
Futter, P.
Chavannes, N.
Kuster, N.
Source :
2010 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC); 2010, p657-659, 3p
Publication Year :
2010

Details

Language :
English
ISBNs :
9781424456215
Database :
Complementary Index
Journal :
2010 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)
Publication Type :
Conference
Accession number :
81601455
Full Text :
https://doi.org/10.1109/APEMC.2010.5475672