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Buffer-ring-based all-digital on-chip monitor for PMOS and NMOS process variability and aging effects.
- Source :
- 2010 IEEE 13th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS); 2010, p167-172, 6p
- Publication Year :
- 2010
Details
- Language :
- English
- ISBNs :
- 9781424466122
- Database :
- Complementary Index
- Journal :
- 2010 IEEE 13th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS)
- Publication Type :
- Conference
- Accession number :
- 81597741
- Full Text :
- https://doi.org/10.1109/DDECS.2010.5491792