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A complete stress enhancement model development and verification platform for 32nm technology and beyond.
- Source :
- 2010 10th IEEE International Conference on Solid-State & Integrated Circuit Technology (ICSICT); 2010, p1871-1873, 3p
- Publication Year :
- 2010
Details
- Language :
- English
- ISBNs :
- 9781424457977
- Database :
- Complementary Index
- Journal :
- 2010 10th IEEE International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
- Publication Type :
- Conference
- Accession number :
- 81572009
- Full Text :
- https://doi.org/10.1109/ICSICT.2010.5667735