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Hicum and BSIM3V3.2.4 non linear behavior validation In RF BICMOS SiGeC 0.25µm process for bipolar and CMOS transistors.
- Source :
- ARFTG Conference, 2007 69th; 2007, p1-4, 4p
- Publication Year :
- 2007
Details
- Language :
- English
- ISBNs :
- 9780780397620
- Database :
- Complementary Index
- Journal :
- ARFTG Conference, 2007 69th
- Publication Type :
- Conference
- Accession number :
- 81569575
- Full Text :
- https://doi.org/10.1109/ARFTG.2007.5456332