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Excitation, observation, and ELF-MD: optimization criteria for high quality test sets.
- Source :
- 22nd IEEE VLSI Test Symposium, 2004. Proceedings; 2004, p9-15, 7p
- Publication Year :
- 2004
Details
- Language :
- English
- ISBNs :
- 9780769521343
- Database :
- Complementary Index
- Journal :
- 22nd IEEE VLSI Test Symposium, 2004. Proceedings
- Publication Type :
- Conference
- Accession number :
- 81554127
- Full Text :
- https://doi.org/10.1109/VTEST.2004.1299219