Efficient Localized Detection of Erroneous Nodes (ELDEN).

Authors :: Behnke, R.
Salzmann, J.
Simanowski, S.
Timmermann, D.
Source :: 2010 IEEE 10th International Conference on Computer & Information Technology (CIT); 2010, p2884-2890, 7p
Publication Year :: 2010

Language :: English
ISBNs :: 9781424475476
Database :: Complementary Index
Journal :: 2010 IEEE 10th International Conference on Computer & Information Technology (CIT)
Publication Type :: Conference
Accession number :: 81535846
Full Text :: https://doi.org/10.1109/CIT.2010.482