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Diagnostic test generation for transition faults using a stuck-at ATPG tool.

Authors :
Higami, Y.
Kurose, Y.
Ohno, S.
Yamaoka, H.
Takahashi, H.
Shimizu, Y.
Aikyo, T.
Takamatsu, Y.
Source :
2009 International Test Conference; 2009, p1-9, 9p
Publication Year :
2009

Details

Language :
English
ISBNs :
9781424448685
Database :
Complementary Index
Journal :
2009 International Test Conference
Publication Type :
Conference
Accession number :
81535219
Full Text :
https://doi.org/10.1109/TEST.2009.5355681
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