A statistical approach for design and testing of analog circuitry in low-cost SoCs.

Details

Language :

English

ISBNs :

9781424477715

Database :

Complementary Index

Journal :

2010 53rd IEEE International Midwest Symposium on Circuits & Systems (MWSCAS)

Publication Type :

Conference

Accession number :

81524226

Full Text :

https://doi.org/10.1109/MWSCAS.2010.5548733