An investigation of low-frequency noise in complementary SiGe HBTs on SOI.

Details

Language :

English

ISBNs :

9781424485789

Database :

Complementary Index

Journal :

2010 IEEE Bipolar/BiCMOS Circuits & Technology Meeting (BCTM)

Publication Type :

Conference

Accession number :

81522299

Full Text :

https://doi.org/10.1109/BIPOL.2010.5667937