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New insight on VT stability of HK/MG stacks with scaling in 30nm FDSOI technology.
- Source :
- 2010 Symposium on VLSI Technology (VLSIT); 2010, p29-30, 2p
- Publication Year :
- 2010
Details
- Language :
- English
- ISBNs :
- 9781424454518
- Database :
- Complementary Index
- Journal :
- 2010 Symposium on VLSI Technology (VLSIT)
- Publication Type :
- Conference
- Accession number :
- 81513455
- Full Text :
- https://doi.org/10.1109/VLSIT.2010.5556131