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A Unified Probabilistic Approach to Feature Matching and Object Segmentation.

Authors :
Tae Hoon Kim
Kyoung Mu Lee
Sang Uk Lee
Source :
2010 20th International Conference on Pattern Recognition (ICPR); 2010, p464-467, 4p
Publication Year :
2010

Details

Language :
English
ISBNs :
9781424475421
Database :
Complementary Index
Journal :
2010 20th International Conference on Pattern Recognition (ICPR)
Publication Type :
Conference
Accession number :
81483905
Full Text :
https://doi.org/10.1109/ICPR.2010.1147