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A method to handle CRC errors on the basis of FlexRay.

Authors :
Seung-Hyun Yoon
Suk-Hyun Seo
Jin-Ho Kim
Key Ho Kwon
Sung-Ho Hwang
Jae Wook Jeon
Source :
2009 IEEE International Symposium on Industrial Electronics; 2009, p670-675, 6p
Publication Year :
2009

Details

Language :
English
ISBNs :
9781424443475
Database :
Complementary Index
Journal :
2009 IEEE International Symposium on Industrial Electronics
Publication Type :
Conference
Accession number :
81481633
Full Text :
https://doi.org/10.1109/ISIE.2009.5213765