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SOI substrate readiness for 22/20 nm and for fully depleted planar device architectures.

Authors :
Delprat, D.
Boedt, F.
David, C.
Reynaud, P.
Alami-Idrissi, A.
Landru, D.
Girard, C.
Maleville, C.
Source :
2009 IEEE International SOI Conference; 2009, p1-4, 4p
Publication Year :
2009

Details

Language :
English
ISBNs :
9781424442560
Database :
Complementary Index
Journal :
2009 IEEE International SOI Conference
Publication Type :
Conference
Accession number :
81480413
Full Text :
https://doi.org/10.1109/SOI.2009.5318744