Bias Stability of zinc-tin-oxide thin film transistors with Al2O3 gate dielectrics.

Details

Language :

English

ISBNs :

9781424439218

Database :

Complementary Index

Journal :

2009 IEEE International Integrated Reliability Workshop Final Report

Publication Type :

Conference

Accession number :

81479964

Full Text :

https://doi.org/10.1109/IRWS.2009.5383025