Count-rate dependent resolution degradation from pulse pile-up on the HRRT.

Details

Language :

English

ISBNs :

9781424491063

Database :

Complementary Index

Journal :

2010 IEEE Nuclear Science Symposium Conference Record (NSS/MIC)

Publication Type :

Conference

Accession number :

81474257

Full Text :

https://doi.org/10.1109/NSSMIC.2010.5874297