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One-Class Ellipsoidal Kernel Machine for Outlier Detection.

Authors :
Bin Chen
Bin Li
Zhisong Pan
Aimin Feng
Source :
2009 Chinese Conference on Pattern Recognition; 2009, p1-5, 5p
Publication Year :
2009

Details

Language :
English
ISBNs :
9781424441990
Database :
Complementary Index
Journal :
2009 Chinese Conference on Pattern Recognition
Publication Type :
Conference
Accession number :
81431982
Full Text :
https://doi.org/10.1109/CCPR.2009.5344141