Application of BCC Algorithm and RBFNN in Identification of Defect Parameters.

Authors :: Kou Wei
Sun Feng-rui
Yang Li
Chen Lin-gen
Source :: 2010 International Symposium on Intelligence Information Processing & Trusted Computing (IPTC); 2010, p638-642, 5p
Publication Year :: 2010

Language :: English
ISBNs :: 9781424481484
Database :: Complementary Index
Journal :: 2010 International Symposium on Intelligence Information Processing & Trusted Computing (IPTC)
Publication Type :: Conference
Accession number :: 81425699
Full Text :: https://doi.org/10.1109/IPTC.2010.15