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Pattern Classification on Local Metric Structure.

Authors :
Washizawa, Y.
Source :
2009 10th International Conference on Document Analysis & Recognition; 2009, p471-475, 5p
Publication Year :
2009

Details

Language :
English
ISBNs :
9781424445004
Database :
Complementary Index
Journal :
2009 10th International Conference on Document Analysis & Recognition
Publication Type :
Conference
Accession number :
81382537
Full Text :
https://doi.org/10.1109/ICDAR.2009.151