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A new concept for quantitative nanoscale imaging with magnetic contrast: Synchrotron x-ray enhanced scanning tunneling microscopy.
- Source :
- 2010 International Conference on Electromagnetics in Advanced Applications (ICEAA); 2010, p201-204, 4p
- Publication Year :
- 2010
Details
- Language :
- English
- ISBNs :
- 9781424473663
- Database :
- Complementary Index
- Journal :
- 2010 International Conference on Electromagnetics in Advanced Applications (ICEAA)
- Publication Type :
- Conference
- Accession number :
- 81370771
- Full Text :
- https://doi.org/10.1109/ICEAA.2010.5652963