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Scan-architecture-based evaluation technique of SET and SEU soft-error rates at each flip-flop in logic VLSI systems.
- Source :
- 2007 9th European Conference on Radiation & Its Effects on Components & Systems; 2007, p1-6, 6p
- Publication Year :
- 2007
Details
- Language :
- English
- ISBNs :
- 9781424417049
- Database :
- Complementary Index
- Journal :
- 2007 9th European Conference on Radiation & Its Effects on Components & Systems
- Publication Type :
- Conference
- Accession number :
- 81360410
- Full Text :
- https://doi.org/10.1109/RADECS.2007.5205569