Measurement of Minority Carrier Lifetime in Hg1-xCdxTe Photodetector.

Authors :: Cui, H.Y.
Li, Z.F.
Xu, X.Y.
Liu, Z.L.
Quan, Z.J.
Lu, W.
Source :: 2006 Joint 31st International Conference on Infrared Millimeter Waves & 14th International Conference on Teraherz Electronics; 2006, p325-325, 1p
Publication Year :: 2006

Language :: English
ISBNs :: 9781424404001
Database :: Complementary Index
Journal :: 2006 Joint 31st International Conference on Infrared Millimeter Waves & 14th International Conference on Teraherz Electronics
Publication Type :: Conference
Accession number :: 81358084
Full Text :: https://doi.org/10.1109/ICIMW.2006.368533