A Signal-Integrity Self-Test Concept for Debugging Nanometer CMOS ICs.

Authors :: Petrescu, V.
Pelgrom, M.
Veendrick, H.
Pavithran, P.
Wieling, J.
Source :: 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers; 2006, p2220-2229, 10p
Publication Year :: 2006

Language :: English
ISBNs :: 9781424400799
Database :: Complementary Index
Journal :: 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers
Publication Type :: Conference
Accession number :: 81351889
Full Text :: https://doi.org/10.1109/ISSCC.2006.1696283