Signal-Margin-Screening for Multi-Mb MRAM.

Authors :: Honigschmid, H.
Beer, P.
Bette, A.
Dittrich, R.
Gardic, R.
Gogl, D.
Lammers, S.
Schmid, J.
Altimime, L.
Bournat, S.
Muller, G.
Source :: 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers; 2006, p467-476, 10p
Publication Year :: 2006

Language :: English
ISBNs :: 9781424400799
Database :: Complementary Index
Journal :: 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers
Publication Type :: Conference
Accession number :: 81351685
Full Text :: https://doi.org/10.1109/ISSCC.2006.1696079