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Characterization and modeling of three CMOS diode structures in the CDM to HBM timeframe.

Authors :
Stockinger, Michael
Miller, James W.
Source :
2006 Electrical Overstress/Electrostatic Discharge Symposium; 2006, p46-53, 8p
Publication Year :
2006

Details

Language :
English
ISBNs :
9781585371150
Database :
Complementary Index
Journal :
2006 Electrical Overstress/Electrostatic Discharge Symposium
Publication Type :
Conference
Accession number :
81348357

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