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Impact of the CDM tester ground plane capacitance on the DUT stress level.

Authors :
Goeau, C.
Richier, C.
Salome, P.
Chante, J.-P.
Jaouen, H.
Source :
2005 Electrical Overstress/Electrostatic Discharge Symposium; 2005, p1-8, 8p
Publication Year :
2005

Details

Language :
English
ISBNs :
9781585370696
Database :
Complementary Index
Journal :
2005 Electrical Overstress/Electrostatic Discharge Symposium
Publication Type :
Conference
Accession number :
81342048

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