Modeling of NBTI degradation and its impact on electric field dependence of the lifetime.

Details

Language :

English

ISBNs :

9780780383159

Database :

Complementary Index

Journal :

Proceedings of the 2004 IEEE International Reliability Physics Symposium

Publication Type :

Conference

Accession number :

81341479

Full Text :

https://doi.org/10.1109/RELPHY.2004.1315296