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Field emission noise caused by capacitance coupling ESD in AMR/GMR heads.

Authors :
Ohtsu, T.
Yoshida, H.
Hatanaka, N.
Source :
2001 Electrical Overstress/Electrostatic Discharge Symposium; 2001, p171-173, 3p
Publication Year :
2001

Details

Language :
English
ISBNs :
9781585370399
Database :
Complementary Index
Journal :
2001 Electrical Overstress/Electrostatic Discharge Symposium
Publication Type :
Conference
Accession number :
81336703

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