Recovery time scales in quantum dot devices.

Authors :: Viktorov, E.A.
Erneux, T.
Mandel, P.
Piwonski, T.
Pulka, J.
Madden, G.
Houlihan, J.
Huyet, G.
Source :: CLEO/Europe - EQEC 2009 - European Conference on Lasers & Electro-Optics & the European Quantum Electronics Conference; 2009, p1-1, 1p
Publication Year :: 2009

Language :: English
ISBNs :: 9781424440795
Database :: Complementary Index
Journal :: CLEO/Europe - EQEC 2009 - European Conference on Lasers & Electro-Optics & the European Quantum Electronics Conference
Publication Type :: Conference
Accession number :: 81320928
Full Text :: https://doi.org/10.1109/CLEOE-EQEC.2009.5191460