Characterization setup for device level dynamic load modulation measurements.

Details

Language :

English

ISBNs :

9781424428038

Database :

Complementary Index

Journal :

2009 IEEE MTT-S International Microwave Symposium Digest

Publication Type :

Conference

Accession number :

81313772

Full Text :

https://doi.org/10.1109/MWSYM.2009.5165917