A Method of Improving Precision in Software Testing Based on Defect Patterns.

Authors :: Jin Dahai
Gong Yunzhan
Xiao Qing
Wang Yawen
Yang Zhaohong
Source :: 2009 International Conference on Industrial & Information Systems; 2009, p285-288, 4p
Publication Year :: 2009

Language :: English
ISBNs :: 9780769536187
Database :: Complementary Index
Journal :: 2009 International Conference on Industrial & Information Systems
Publication Type :: Conference
Accession number :: 81308700
Full Text :: https://doi.org/10.1109/IIS.2009.14