Investigation of Window Instability in Program/Erase Cycling of TANOS NAND Flash Memory.

Details

Language :

English

ISBNs :

9781424437627

Database :

Complementary Index

Journal :

2009 IEEE International Memory Workshop

Publication Type :

Conference

Accession number :

81307791

Full Text :

https://doi.org/10.1109/IMW.2009.5090596