Control of defects and impurities at GaN and AlGaN surfaces for FET and sensor applications.

Details

Language :

English

ISBNs :

9781424403691

Database :

Complementary Index

Journal :

2006 International Conference on Advanced Semiconductor Devices & Microsystems (9781424403691)

Publication Type :

Conference

Accession number :

81304651

Full Text :

https://doi.org/10.1109/ASDAM.2006.331194