Contact materials and reliability for high power RF-MEMS switches.

Details

Language :

English

Database :

Complementary Index

Journal :

2007 IEEE 20th International Conference on Micro Electro Mechanical Systems (MEMS)

Publication Type :

Conference

Accession number :

81302728

Full Text :

https://doi.org/10.1109/MEMSYS.2007.4433055