Profiling of a GaAs structure using the probe method.

Authors :: Kinder, R.
Srnanek, R.
Walachova, J.
Hulenyi, L.
Tlaczala, M.
Sciana, B.
Radziewicz, D.
Source :: Fourth International Conference on Advanced Semiconductor Devices & Microsystem; 2002, p231-234, 4p
Publication Year :: 2002

Language :: English
ISBNs :: 9780780372764
Database :: Complementary Index
Journal :: Fourth International Conference on Advanced Semiconductor Devices & Microsystem
Publication Type :: Conference
Accession number :: 81293920
Full Text :: https://doi.org/10.1109/ASDAM.2002.1088514