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Impact-factor-guided X-filling for peak power reduction during test.
- Source :
- TENCON 2007 - 2007 IEEE Region 10 Conference; 2007, p1-4, 4p
- Publication Year :
- 2007
Details
- Language :
- English
- ISBNs :
- 9781424412723
- Database :
- Complementary Index
- Journal :
- TENCON 2007 - 2007 IEEE Region 10 Conference
- Publication Type :
- Conference
- Accession number :
- 81286645
- Full Text :
- https://doi.org/10.1109/TENCON.2007.4429150