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Stress characterization of electroplated gold layers for low temperature surface micromachining.

Authors :
Margesin, B.
Bagolini, A.
Guarnieri, V.
Giacomozzi, F.
Faes, A.
Pal, R.
Decarli, M.
Source :
Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS 2003; 2003, p402-405, 4p
Publication Year :
2003

Details

Language :
English
ISBNs :
9780780370661
Database :
Complementary Index
Journal :
Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS 2003
Publication Type :
Conference
Accession number :
81282645
Full Text :
https://doi.org/10.1109/DTIP.2003.1287077